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The characteristic of HfO2 on strained SiGe

โœ Scribed by T.C. Chen; L.S. Lee; W.Z. Lai; C.W. Liu


Book ID
103846337
Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
307 KB
Volume
8
Category
Article
ISSN
1369-8001

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