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Modeling of Strained CMOS on Disposable SiGe Dots: Strain Impacts on Devices' Electrical Characteristics

✍ Scribed by Fregonese, S.; Yan Zhuang; Burghartz, J.N.

Book ID: 114618870
Publisher: IEEE
Year: 2007
Tongue: English
Weight: 926 KB
Volume: 54
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2007.902719

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