Testing the Temperature Limits of GaN-Based HEMT Devices

✍ Scribed by Maier, David; Alomari, Mohammed; Grandjean, Nicolas; Carlin, Jean-Francois; Diforte-Poisson, Marie-Antoinette; Dua, Christian; Chuvilin, Andrey; Troadec, David; Gaquiere, Christophe; Kaiser, Ute; Delage, Sylvain L.; Kohn, Erhard

• Book ID: 120345199
• Publisher: IEEE
• Year: 2010
• Tongue: English
• Weight: 911 KB
• Volume: 10
• Category: Article
• ISSN: 1530-4388
• DOI: 10.1109/TDMR.2010.2072507