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Analysis of the degradation of AlGaN/GaN HEMTs by high-temperature operation tests

✍ Scribed by Lee, Jong-Min; Min, Byoung-Gue; Ju, Cheol-Won; Ahn, Ho-Kyun; Mun, Jae-Kyoung; Lim, Jong-Won; Nam, Eunsoo

Book ID: 125416500
Publisher: The Korean Physical Society
Year: 2014
Tongue: English
Weight: 324 KB
Volume: 64
Category: Article
ISSN: 0374-4884
DOI: 10.3938/jkps.64.1446

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