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Temperature scaling for 35 nm gate length high-performance CMOS

✍ Scribed by Th. Feudel; M. Horstmann; M. Gerhardt; M. Herden; L. Herrmann; D. Gehre; Ch. Krueger; D. Greenlaw; M. Raab

Book ID: 103846350
Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 579 KB
Volume: 7
Category: Article
ISSN: 1369-8001
DOI: 10.1016/j.mssp.2004.09.063

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Temperature scaling for 35&#xa0;nm gate length high-performance CMOS

Temperature scaling for 35 nm gate length high-performance CMOS