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Temperature-dependent retardation effect of dopants on oxygen diffusion in heavily doped Czochralski silicon

โœ Scribed by Takeno, Hiroshi; Sunakawa, Ken; Suezawa, Masashi


Book ID
120809169
Publisher
American Institute of Physics
Year
2000
Tongue
English
Weight
262 KB
Volume
77
Category
Article
ISSN
0003-6951

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Effects of high temperature rapid therma
โœ Biao Wang; Xinpeng Zhang; Xiangyang Ma; Deren Yang ๐Ÿ“‚ Article ๐Ÿ“… 2011 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 545 KB

Oxygen precipitation (OP) behaviors in heavily arsenic-doped Czochralski silicon wafers without and with prior rapid thermal processing at 1100-1250 1C, subjected to subsequent two-step anneal of 450, 650 and 800 1C/4 h+1000 1C/16 h, have been investigated. It is found that the prior RTP at 1250 1C