## Abstract The formation of an oxygen precipitate denuded zone in nitrogenβdoped Czochralski (NCZ) silicon and conventional CZ silicon subjected to ramping anneals under Ar or O~2~ ambient has been investigated. It is revealed that the nitrogen doping is able to homogenize substantially the densit
The effect of the ramping rate on oxygen precipitation and the denuded zone in heavily doped Czochralski silicon
β Scribed by Zhao, Yiying; Li, Dongsheng; Ma, Xiangyang; Yang, Deren
- Book ID
- 111866566
- Publisher
- Institute of Physics
- Year
- 2004
- Tongue
- English
- Weight
- 127 KB
- Volume
- 16
- Category
- Article
- ISSN
- 0953-8984
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The effect of rapid thermal process (RTP) on the oxygen precipitation and on the denuded zone (DZ) formation in nitrogen-doped Czochralski (NCZ) silicon wafers has been investigated. The DZ can be formed at the surface of NCZ wafers subjected to RTP annealing. However, the oxygen precipitation and b
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