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Surface states at the nGaAsSiO2 interface from conductance and capacitance measurements

✍ Scribed by R.L. Streever; J.T. Breslin; E.H. Ahlstrom


Publisher
Elsevier Science
Year
1980
Tongue
English
Weight
611 KB
Volume
23
Category
Article
ISSN
0038-1101

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