Some electrical properties of the GaAs-anodic oxide interface on the basis of measurements of the capacitance-voltage and conductance-voltage characteristics of metal-oxide-semiconductor structures

✍ Scribed by St. Łos̀; St. Kochowski

• Publisher: Elsevier Science
• Year: 1988
• Tongue: English
• Weight: 401 KB
• Volume: 165
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(88)90675-x