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Measurement of low densities of surface states at the Si-SiO2-interface : G. Declerck, R. Van Overstraeten and G. Broux. Solid St. Electronics16, 1451 (1973)

Publisher: Elsevier Science
Year: 1974
Tongue: English
Weight: 111 KB
Volume: 13
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(74)90541-1

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Measurement of low densities of surface

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Influence of interface charge inhomogene

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