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Measurement of low densities of surface states at the SiSiO2-interface

✍ Scribed by G. Declerck; R. Van Overstraeten; G. Broux

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Measurement of low densities of surface

📂 Article 📅 1974 🏛 Elsevier Science 🌐 English ⚖ 111 KB

Determination of the state density at th

✍ GianFranco Cerofolini; Giuseppe Ferla; GianPaolo Spadini 📂 Article 📅 1980 🏛 Elsevier Science 🌐 English ⚖ 849 KB

Electronic states at SiSiO2 interface i

✍ A. Kalnitsky; A.R. Boothroyd; J.P. Ellul; E.H. Poindexter; P.J. Caplan 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 847 KB

Surface states at the nGaAsSiO2 interf

✍ R.L. Streever; J.T. Breslin; E.H. Ahlstrom 📂 Article 📅 1980 🏛 Elsevier Science 🌐 English ⚖ 611 KB

Ellipsometric study of Si surface roughn

✍ A Aizenberg; AV Andrianov; SV Nosenko; VI Pshenicin; IA Hromcovski 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 125 KB

Models for the SiSiO2 interface degrada

✍ A. Mir; D. Vuillaume 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 758 KB