Complete exploration of the silicon gap at the SiSiO2 interface of MIS tunnel diodes using the conductance technique at various temperatures and illumination levels

✍ Scribed by M. El-Sayed; G. Pananakakis; G. Kamarinos

• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 900 KB
• Volume: 28
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(85)90095-4