Complete exploration of the silicon gap at the Si-SiO2 interface of MIS tunnel diodes using the conductance technique at various temperatures and illumination levels : M. El-Sayed, G. Pananakakis and G. Kamarinos. Solid-St. Electron.28 (4) 345 (1985)

• Publisher: Elsevier Science
• Year: 1986
• Tongue: English
• Weight: 130 KB
• Volume: 26
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(86)90174-5