✦ LIBER ✦
5191. Low-temperature annealing and hydrogenation of defects at the SiSiO2 interface: N M Johnson et al, J Vac Sci Technol, 19 (3), 1981, 390–394
- Publisher
- Elsevier Science
- Year
- 1982
- Tongue
- English
- Weight
- 145 KB
- Volume
- 32
- Category
- Article
- ISSN
- 0042-207X
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