✦ LIBER ✦

Surface cleanup and sputtered ion production: Observations with AES and SIMS

✍ Scribed by Joe N. Smith Jr.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Ultimate depth resolution and profile re

✍ Siegfried Hofmann 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 200 KB

Sputtering process of a silicon carbide

✍ Mamoru Mohri; Kuniaki Watanabe; Toshiro Yamashina 📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 590 KB

Application of AES-SIMS (IMA)-FDS combin

✍ Toshiro Yamashina; Mamoru Mohri; Kuniaki Watanabe; Hiroshi Doi; Kazunobu Hayakaw 📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 168 KB

AES-ion sputtering analysis and the surf

✍ Simon Thomas 📂 Article 📅 1976 🏛 Elsevier Science 🌐 English ⚖ 478 KB

AES-SIMS(IMA)study of physical and chemi

✍ M. Mohri; K. Watanabe; T. Yamashina; H. Doi; K. Hayakawa 📂 Article 📅 1979 🏛 Elsevier Science 🌐 English ⚖ 354 KB

Analysis of surface layers by light ion

✍ R. Behrisch; B.M.U. Scherzer; P. Staib 📂 Article 📅 1973 🏛 Elsevier Science 🌐 English ⚖ 500 KB