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Study of surface and interface roughnesses in porous silicon by high-resolution X-ray methods

✍ Scribed by A. A. Lomov; V. A. Bushuev; V. A. Karavanskii

Book ID
110124930
Publisher
SP MAIK Nauka/Interperiodica
Year
2000
Tongue
English
Weight
83 KB
Volume
45
Category
Article
ISSN
1063-7745

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A diffractometer employing ideal crystals, providing an angular resolution of about one arc second, was used for the measurement of the angular distribution of intensity of neutron beams that were diffracted by silicon crystals near the Bragg position and specularly reflected by the crystal surfaces