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Structure and correlations in porous silicon studied by X-ray scattering methods

✍ Scribed by M. Binder; T. Edelmann; T.H. Metzger; J. Peisl

Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
487 KB
Volume
100
Category
Article
ISSN
0038-1098

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## Abstract In this paper, porous silicon (PS) layers of different porosity and thickness have been investigated by Raman spectroscopy. The estimation of built‐in strain in PS is reported. Moreover, wetting phenomena in PS layers have been also investigated. The results prove a reversible blue shif