XPS and x-ray-induced AES have been used to study the reaction layers formed on silicon powder samples heated in ultra-high purity nitrogen at temperatures between 1100 and 1200 "C. An equation was derived to calculate the average surface reaction layer thicknesses from the silicon AES spectra. The
✦ LIBER ✦
The coordination of aluminum and silicon in zeolites as studied by x-ray spectrometry
✍ Scribed by G.H. Kühl
- Publisher
- Elsevier Science
- Year
- 1977
- Tongue
- English
- Weight
- 697 KB
- Volume
- 38
- Category
- Article
- ISSN
- 0022-3697
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