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Characterization of Dislocation Densities in Germanium and Silicon Single Crystals by High Resolution X-Ray Diffraction

✍ Scribed by Sous, S. A. ;Hildmann, B. O. ;Kaysser, W. A.

Publisher
John Wiley and Sons
Year
1997
Tongue
English
Weight
292 KB
Volume
159
Category
Article
ISSN
0031-8965

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