Study of structure and surface of silicon by means of neutron optical methods with high angular resolution
โ Scribed by K.M. Podurets; S.Sh. Shilstein; F. Eichhorn; Z.N. Soroko
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 136 KB
- Volume
- 174
- Category
- Article
- ISSN
- 0921-4526
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โฆ Synopsis
A diffractometer employing ideal crystals, providing an angular resolution of about one arc second, was used for the measurement of the angular distribution of intensity of neutron beams that were diffracted by silicon crystals near the Bragg position and specularly reflected by the crystal surfaces. New possibilities of studying the perfection of the bulk crystal structure, surfaces and films are demonstrated.
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