✦ LIBER ✦

Characterization of interface roughness in W/Si multilayers by high resolution diffuse X-ray scattering

✍ Scribed by T. Salditt; D. Lott; T.H. Metzger; J. Peisl; G. Vignaud; J.F. Legrand; G. Grübel; P. Høghøi; O. Schärpf

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Characterization of nearly perfect alkal

✍ Krishan Lal; Bhanu Pratap Singh 📂 Article 📅 1981 🏛 Elsevier Science 🌐 English ⚖ 614 KB

Characterization of Si/Ge interfaces by

✍ J.-P. Schlomka; M.R. Fitzsimmons; R. Pynn; J. Stettner; O.H. Seeck; M. Tolan; W. 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 673 KB

Characterization of Dislocation Densitie

✍ Sous, S. A. ;Hildmann, B. O. ;Kaysser, W. A. 📂 Article 📅 1997 🏛 John Wiley and Sons 🌐 English ⚖ 292 KB 👁 2 views