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Size and surface effects in porous silicon studied by X-ray absorption spectroscopy

✍ Scribed by Daldosso, N. ;Dalba, G. ;Fornasini, P. ;Grisenti, R. ;Rocca, F.

Publisher
John Wiley and Sons
Year
2003
Tongue
English
Weight
137 KB
Volume
197
Category
Article
ISSN
0031-8965

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## Abstract X‐ray photoelectron spectroscopy (XPS) and Bremsstrahlung‐excited Auger electron spectroscopy (XAES) were used to study the surface composition and oxidation of silicon carbide platelets which had been heated in air at 500–800Β° C. The surface oxide thickness for each heating time and te