Epitaxial growth of silicon carbide laye
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Dr. Yu. A. Vodakov; E. N. Mokhov; M. G. Ramm; A. D. Roenkov
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Article
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1979
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John Wiley and Sons
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English
β 826 KB
The growth kinetics of Sic epitaxial layers has been investigated by sublimation sandwichmethod in vacuum a t temperature range from 1600 to 2100 O C . The limiting stages of the crystallization process have been determined. Silicon deficit in the growth cell was shown to result in the great retardi