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Study of electrical and interfacial properties of CVD-W/p-Si0.83Ge0.17/Si(001)

✍ Scribed by Y.C. Jang; K.S. Kim; D.O. Shin; H.J. Kim; K.-H. Shim; N.-E. Lee; S.P. Youn; K.J. Roh; Y.H. Roh

No coin nor oath required. For personal study only.

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