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Study of 3C-SiC crystal defects by microbeam channeling methods

✍ Scribed by H. Sekiguchi; T. Nishijima; I. Nashiyama; S. Misawa; S. Yoshida

Book ID: 113286616
Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 606 KB
Volume: 104
Category: Article
ISSN: 0168-583X
DOI: 10.1016/0168-583x(95)00467-x

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