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Optically detected magnetic resonance studies of defects in electron-irradiated 3C SiC layers

✍ Scribed by Son, N. T.; Sörman, E.; Chen, W. M.; Hallin, C.; Kordina, O.; Monemar, B.; Janzén, E.; Lindström, J. L.

No coin nor oath required. For personal study only.

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