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Optically detected magnetic resonance studies of defects in 3C SiC epitaxial layers

✍ Scribed by Son, N.T.; Sörman, E.; Chen, W.M.; Hallin, C.; Kordina, O.; Monemar, B.; Janzén, E.

Book ID: 123167204
Publisher: Elsevier Science
Year: 1997
Tongue: English
Weight: 454 KB
Volume: 6
Category: Article
ISSN: 0925-9635
DOI: 10.1016/S0925-9635(97)00099-X

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