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Radiation-Induced Pair Defects in 6H-SiC Studied by Optically Detected Magnetic Resonance

✍ Scribed by Lingner, Th.; Greulich-Weber, S.; Spaeth, Johann Martin

Book ID: 120993732
Publisher: Trans Tech Publications, Ltd.
Year: 2001
Tongue: English
Weight: 329 KB
Volume: 353-356
Category: Article
ISSN: 1662-9752
DOI: 10.4028/www.scientific.net/MSF.353-356.505

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