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The probability of pairwise defects creation in 3C–SiC as calculated by Xα-DV method

✍ Scribed by Elmira I. Yuryeva

Book ID: 116374472
Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 152 KB
Volume: 36
Category: Article
ISSN: 0927-0256
DOI: 10.1016/j.commatsci.2005.02.021

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