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XPS and XRD study of crystalline 3C-SiC grown by sublimation method

✍ Scribed by R.J Iwanowski; K Fronc; W Paszkowicz; M Heinonen

Book ID: 117625240
Publisher: Elsevier Science
Year: 1999
Tongue: English
Weight: 112 KB
Volume: 286
Category: Article
ISSN: 0925-8388
DOI: 10.1016/s0925-8388(98)00994-3

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