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Structural perfection of GaN epitaxial layers according to x-ray diffraction measurements

✍ Scribed by R. N. Kyutt; V. V. Ratnikov; G. N. Mosina; M. P. Shcheglov

Book ID: 110118810
Publisher: SP MAIK Nauka/Interperiodica
Year: 1999
Tongue: English
Weight: 493 KB
Volume: 41
Category: Article
ISSN: 1063-7834
DOI: 10.1134/1.1130722

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