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In situ X-ray diffraction monitoring during metalorganic vapor phase epitaxy growth of low-temperature-GaN buffer layer

✍ Scribed by Iida, Daisuke; Sowa, Mihoko; Kondo, Yasunari; Tanaka, Daiki; Iwaya, Motoaki; Takeuchi, Tetsuya; Kamiyama, Satoshi; Akasaki, Isamu

Book ID: 119292397
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 553 KB
Volume: 361
Category: Article
ISSN: 0022-0248
DOI: 10.1016/j.jcrysgro.2012.08.023

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