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X-ray diffraction reciprocal space and pole figure characterization of cubic GaN epitaxial layers grown on (0 0 1) GaAs by molecular beam epitaxy

✍ Scribed by Zhixin Qin; Masakazu Kobayashi; Akihiko Yoshikawa


Book ID
110270724
Publisher
Springer US
Year
1999
Tongue
English
Weight
139 KB
Volume
10
Category
Article
ISSN
0957-4522

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