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Structural properties of GaN(0001) epitaxial layers revealed by high resolution X-ray diffraction

✍ Scribed by ZiLi Xie; YuanJun Zhou; LiHong Song; Bin Liu; XueMei Hua; XiangQian Xiu; Rong Zhang; YouDou Zheng

Book ID: 107363586
Publisher: Science in China Press (SCP)
Year: 2010
Tongue: English
Weight: 670 KB
Volume: 53
Category: Article
ISSN: 1672-1799
DOI: 10.1007/s11433-010-0102-5

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## Abstract A high resolution X‐ray diffraction method has been effectively used for the structural characterization of InP porous layers. It was revealed that strong diffuse scattering from pores around reciprocal lattice points does depend on the azimuth positions of samples. To extract structura