Thermally Induced Strain in ZnSe and GaN Epitaxial Layers Studied by High-Resolution X-Ray Diffraction at Variable Temperatures

✍ Scribed by Heinke, H. ;Haase, L. ;Grossmann, V. ;Kirchner, V. ;Hommel, D.

• Publisher: John Wiley and Sons
• Year: 2000
• Tongue: English
• Weight: 118 KB
• Volume: 180
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/1521-396x(200007)180:1<189::aid-pssa189>3.0.co;2-3