๐”– Bobbio Scriptorium
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Structural design optimization for board-level drop reliability of wafer-level chip-scale packages

โœ Scribed by Tsung-Yueh Tsai; Yi-Shao Lai; Chang-Lin Yeh; Rong-Sheng Chen


Book ID
118486163
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
766 KB
Volume
48
Category
Article
ISSN
0026-2714

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