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Structural characterization of Si1 −xGexultrathin quantum wells in a Si matrix by high-resolution X-ray diffraction

✍ Scribed by A. M. Afanas’ev; M. A. Chuev; R. M. Imamov; É. Kh. Mukhamedzhanov; M. M. Rzaev; F. Schäffler; M. Müehlberger

Book ID: 110132967
Publisher: SP MAIK Nauka/Interperiodica
Year: 2002
Tongue: English
Weight: 68 KB
Volume: 47
Category: Article
ISSN: 1063-7745
DOI: 10.1134/1.1523527

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