✦ LIBER ✦
Characterization of (In,Ga)As/GaAs strained-layer multiple quantum wells with high-resolution X-ray diffraction and computer simulations
✍ Scribed by R. Zaus; M. Schuster; H. Göbel; J.-P. Reithmaier
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 315 KB
- Volume
- 50
- Category
- Article
- ISSN
- 0169-4332
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