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Characterization of Selectively Doped InAs-Quantum-Dot GaAs-Based Multilayer Heterostructures by High-Resolution X-ray Diffraction

✍ Scribed by E. M. Pashaev; S. N. Yakunin; A. A. Zaitsev; V. G. Mokerov; Yu. V. Fedorov; R. M. Imamov

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