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Characterization of a Quantum Well in an Si/Si1–xGex/Si Heterostructure by X-ray Diffractometry

✍ Scribed by A. M. Afanas'ev; A. P. Boltaev; R. M. Imamov; E. Kh. Mukhamedzhanov; M. M. Rzaev; M. A. Chuev

No coin nor oath required. For personal study only.

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