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Determination of Germanium Content and Relaxation in Si1—xGex/Si Layers by Raman Spectroscopy and X-Ray Diffractometry

✍ Scribed by Bhagavannarayana, G. ;Dietrich, B. ;Zaumseil, Z. ;Dombrowski, K. F.

Publisher
John Wiley and Sons
Year
1999
Tongue
English
Weight
178 KB
Volume
172
Category
Article
ISSN
0031-8965

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