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Strain controlled growth of crack-free GaN with low defect density on silicon (1 1 1) substrate

✍ Scribed by P. Drechsel; H. Riechert

Book ID: 108166148
Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 888 KB
Volume: 315
Category: Article
ISSN: 0022-0248
DOI: 10.1016/j.jcrysgro.2010.09.024

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