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Characterization of crystal lattice constant and dislocation density of crack-free GaN films grown on Si(1 1 1)

✍ Scribed by Jijun Xiong; Jianjun Tang; Ting Liang; Yong Wang; Chenyang Xue; Weili Shi; Wendong Zhang

Book ID: 103820304
Publisher: Elsevier Science
Year: 2010
Tongue: English
Weight: 437 KB
Volume: 257
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2010.07.073

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