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Statistics of successive breakdown events in gate oxides

✍ Scribed by Sune, J.; Wu, E.Y.

Book ID: 115462003
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 329 KB
Volume: 24
Category: Article
ISSN: 0741-3106
DOI: 10.1109/led.2003.812139

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