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Micro breakdown in small-area ultrathin gate oxides

✍ Scribed by Cellere, G.; Larcher, L.; Valentini, M.G.; Paccagnella, A.

Book ID: 114616823
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 287 KB
Volume: 49
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2002.801443

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