✦ LIBER ✦
Thickness-dependent power-law of dielectric breakdown in ultrathin NMOS gate oxides
✍ Scribed by A. Hiraiwa; D. Ishikawa
- Publisher
- Elsevier Science
- Year
- 2005
- Tongue
- English
- Weight
- 447 KB
- Volume
- 80
- Category
- Article
- ISSN
- 0167-9317
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