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Time dependent breakdown of ultrathin gate oxide

✍ Scribed by Yassine, A.M.; Nariman, H.E.; McBride, M.; Uzer, M.; Olasupo, K.R.


Book ID
114538211
Publisher
IEEE
Year
2000
Tongue
English
Weight
112 KB
Volume
47
Category
Article
ISSN
0018-9383

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