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Statistical Analysis of Neutron-Induced Gain Degradation of Power Transistors

✍ Scribed by Rosenberg, C.; Arimura, I.; Unwin, A. M.

Book ID: 117928526
Publisher: IEEE
Year: 1970
Tongue: English
Weight: 715 KB
Volume: 17
Category: Article
ISSN: 0018-9499
DOI: 10.1109/tns.1970.4325784

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