Development of MOS Transistors for Radiation-Hardened Large Scale Integrated Circuits and Analysis of Radiation-Induced Degradation

✍ Scribed by KAMIMURA, Hiroshi; YOSHIOKA, Shinichi; AKIYAMA, Masatsugu; NAKAMURA, Mitsuhiro; TAMURA, Takashi; KUBOYAMA, Satoshi

• Book ID: 121452052
• Publisher: Japan Science and Technology Information Aggregator, Electronic
• Year: 1994
• Tongue: English
• Weight: 859 KB
• Volume: 31
• Category: Article
• ISSN: 0022-3131
• DOI: 10.1080/18811248.1994.9735112