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Analysis of gamma-irradiation induced degradation mechanisms in power VDMOSFETS

✍ Scribed by N. Stojadinović; S. Golubović; S. Djorić; S. Dimitrijev

Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 791 KB
Volume: 35
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(95)93077-n

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